dcdc3_vol = 1250 dram_clk = 540 dram_type = 3 dram_rank_num = 1 dram_chip_density = 4096 dram_io_width = 16 dram_bus_width = 32 dram_cas = 9 dram_zq = 0x7f dram_odt_en = 0 dram_tpr0 = 0x42d899b7 dram_tpr1 = 0xa090 dram_tpr2 = 0x22a00 dram_tpr3 = 0x0 dram_emr1 = 0x4 dram_emr2 = 0x10 dram_emr3 = 0x0 | |
mfxdly | phase=36 | phase=54 | phase=72 | phase=90 | phase=108 | phase=126 |
---|
0x07 | 0x073333 | 0x072222 | 0x071111 | 0x070000 | 0x07EEEE | 0x07DDDD |
---|
0x06 | 0x063333 | 0x062222 | 0x061111 | 0x060000 | 0x06EEEE | 0x06DDDD |
---|
0x05 | 0x053333 | 0x052222 | 0x051111 | 0x050000 | 0x05EEEE | 0x05DDDD |
---|
0x04 | 0x043333 | 0x042222 | 0x041111 | 0x040000 | 0x04EEEE | 0x04DDDD |
---|
0x03 | 0x033333 | 0x032222 | 0x031111 | 0x030000 | 0x03EEEE | 0x03DDDD |
---|
0x02 | 0x023333 | 0x022222 | 0x021111 | 0x020000 | 0x02EEEE | 0x02DDDD |
---|
0x01 | 0x013333 | 0x012222 | 0x011111 | 0x010000 | 0x01EEEE | 0x01DDDD |
---|
0x00 | 0x003333 | 0x002222 | 0x001111 | 0x000000 | 0x00EEEE | 0x00DDDD |
---|
0x08 | 0x083333 | 0x082222 | 0x081111 | 0x080000 | 0x08EEEE | 0x08DDDD |
---|
0x10 | 0x103333 | 0x102222 | 0x101111 | 0x100000 | 0x10EEEE | 0x10DDDD |
---|
0x18 | 0x183333 | 0x182222 | 0x181111 | 0x180000 | 0x18EEEE | 0x18DDDD |
---|
0x20 | 0x203333 | 0x202222 | 0x201111 | 0x200000 | 0x20EEEE | 0x20DDDD |
---|
0x28 | 0x283333 | 0x282222 | 0x281111 | 0x280000 | 0x28EEEE | 0x28DDDD |
---|
0x30 | 0x303333 | 0x302222 | 0x301111 | 0x300000 | 0x30EEEE | 0x30DDDD |
---|
0x38 | 0x383333 | 0x382222 | 0x381111 | 0x380000 | 0x38EEEE | 0x38DDDD |
---|
| Lane phase adjustments: [0, 0, 0, 0]
Error statistics from memtester: [solidbits=17, bitflip=13, bitspread=11]
Best number of successful memtester runs, which span over 1 columns (3-3): 60 Best number of successful memtester runs, which span over 2 columns (2-3): 96 Best number of successful memtester runs, which span over 3 columns (1-3): 122 Best number of successful memtester runs, which span over 4 columns (1-4): 131 Best number of successful memtester runs, which span over 5 columns (1-5): 131 Best number of successful memtester runs, which span over 6 columns (0-5): 131
Errors per lane: [20, 14, 27, 22]. Lane 1 is the most noisy/problematic.
Errors from the lane 0 are 63.6% eclipsed by the worst lane 1. Errors from the lane 2 are 100.0% eclipsed by the worst lane 1. Errors from the lane 3 are 70.0% eclipsed by the worst lane 1.
|
dcdc3_vol = 1250 dram_clk = 540 dram_type = 3 dram_rank_num = 1 dram_chip_density = 4096 dram_io_width = 16 dram_bus_width = 32 dram_cas = 9 dram_zq = 0x7f dram_odt_en = 0 dram_tpr0 = 0x42d899b7 dram_tpr1 = 0xa090 dram_tpr2 = 0x22a00 dram_tpr3 = 0x0 dram_emr1 = 0x4 dram_emr2 = 0x10 dram_emr3 = 0x0 | |
mfxdly | phase=36 | phase=54 | phase=72 | phase=90 | phase=108 | phase=126 |
---|
0x07 | 0x072232 | 0x071121 | 0x070010 | 0x07EE0E | 0x07DDED | |
---|
0x06 | 0x062232 | 0x061121 | 0x060010 | 0x06EE0E | 0x06DDED | |
---|
0x05 | 0x052232 | 0x051121 | 0x050010 | 0x05EE0E | 0x05DDED | |
---|
0x04 | 0x042232 | 0x041121 | 0x040010 | 0x04EE0E | 0x04DDED | |
---|
0x03 | 0x032232 | 0x031121 | 0x030010 | 0x03EE0E | 0x03DDED | |
---|
0x02 | 0x022232 | 0x021121 | 0x020010 | 0x02EE0E | 0x02DDED | |
---|
0x01 | 0x012232 | 0x011121 | 0x010010 | 0x01EE0E | 0x01DDED | |
---|
0x00 | 0x002232 | 0x001121 | 0x000010 | 0x00EE0E | 0x00DDED | |
---|
0x08 | 0x082232 | 0x081121 | 0x080010 | 0x08EE0E | 0x08DDED | |
---|
0x10 | 0x102232 | 0x101121 | 0x100010 | 0x10EE0E | 0x10DDED | |
---|
0x18 | 0x182232 | 0x181121 | 0x180010 | 0x18EE0E | 0x18DDED | |
---|
0x20 | 0x202232 | 0x201121 | 0x200010 | 0x20EE0E | 0x20DDED | |
---|
0x28 | 0x282232 | 0x281121 | 0x280010 | 0x28EE0E | 0x28DDED | |
---|
0x30 | 0x302232 | 0x301121 | 0x300010 | 0x30EE0E | 0x30DDED | |
---|
0x38 | 0x382232 | 0x381121 | 0x380010 | 0x38EE0E | 0x38DDED | |
---|
| Lane phase adjustments: [1, 1, 0, 1]
Error statistics from memtester: [solidbits=13, bitflip=10, bitspread=9]
Best number of successful memtester runs, which span over 1 columns (2-2): 18 Best number of successful memtester runs, which span over 2 columns (1-2): 36 Best number of successful memtester runs, which span over 3 columns (1-3): 39 Best number of successful memtester runs, which span over 4 columns (0-3): 42 Best number of successful memtester runs, which span over 5 columns (0-4): 42
Errors per lane: [16, 10, 19, 14]. Lane 1 is the most noisy/problematic.
Errors from the lane 0 are 64.3% eclipsed by the worst lane 1. Errors from the lane 2 are 90.0% eclipsed by the worst lane 1. Errors from the lane 3 are 56.2% eclipsed by the worst lane 1.
|
dcdc3_vol = 1250 dram_clk = 540 dram_type = 3 dram_rank_num = 1 dram_chip_density = 4096 dram_io_width = 16 dram_bus_width = 32 dram_cas = 9 dram_zq = 0x7f dram_odt_en = 0 dram_tpr0 = 0x42d899b7 dram_tpr1 = 0xa090 dram_tpr2 = 0x22a00 dram_tpr3 = 0x0 dram_emr1 = 0x4 dram_emr2 = 0x10 dram_emr3 = 0x0 | |
mfxdly | phase=36 | phase=54 | phase=72 | phase=90 | phase=108 | phase=126 |
---|
0x07 | 0x071131 | 0x070020 | 0x07EE1E | 0x07DD0D | | |
---|
0x06 | 0x061131 | 0x060020 | 0x06EE1E | 0x06DD0D | | |
---|
0x05 | 0x051131 | 0x050020 | 0x05EE1E | 0x05DD0D | | |
---|
0x04 | 0x041131 | 0x040020 | 0x04EE1E | 0x04DD0D | | |
---|
0x03 | 0x031131 | 0x030020 | 0x03EE1E | 0x03DD0D | | |
---|
0x02 | 0x021131 | 0x020020 | 0x02EE1E | 0x02DD0D | | |
---|
0x01 | 0x011131 | 0x010020 | 0x01EE1E | 0x01DD0D | | |
---|
0x00 | 0x001131 | 0x000020 | 0x00EE1E | 0x00DD0D | | |
---|
0x08 | 0x081131 | 0x080020 | 0x08EE1E | 0x08DD0D | | |
---|
0x10 | 0x101131 | 0x100020 | 0x10EE1E | 0x10DD0D | | |
---|
0x18 | 0x181131 | 0x180020 | 0x18EE1E | 0x18DD0D | | |
---|
0x20 | 0x201131 | 0x200020 | 0x20EE1E | 0x20DD0D | | |
---|
0x28 | 0x281131 | 0x280020 | 0x28EE1E | 0x28DD0D | | |
---|
0x30 | 0x301131 | 0x300020 | 0x30EE1E | 0x30DD0D | | |
---|
0x38 | 0x381131 | 0x380020 | 0x38EE1E | 0x38DD0D | | |
---|
| Lane phase adjustments: [2, 2, 0, 2]
Error statistics from memtester: [solidbits=14, bitspread=11, bitflip=3]
Best number of successful memtester runs, which span over 1 columns (1-1): 37 Best number of successful memtester runs, which span over 2 columns (0-1): 43 Best number of successful memtester runs, which span over 3 columns (0-2): 45 Best number of successful memtester runs, which span over 4 columns (0-3): 45
Errors per lane: [7, 2, 14, 11]. Lane 1 is the most noisy/problematic.
Errors from the lane 0 are 18.2% eclipsed by the worst lane 1. Errors from the lane 2 are 100.0% eclipsed by the worst lane 1. Errors from the lane 3 are 28.6% eclipsed by the worst lane 1.
|
dcdc3_vol = 1250 dram_clk = 540 dram_type = 3 dram_rank_num = 1 dram_chip_density = 4096 dram_io_width = 16 dram_bus_width = 32 dram_cas = 9 dram_zq = 0x7f dram_odt_en = 0 dram_tpr0 = 0x42d899b7 dram_tpr1 = 0xa090 dram_tpr2 = 0x22a00 dram_tpr3 = 0x0 dram_emr1 = 0x4 dram_emr2 = 0x10 dram_emr3 = 0x0 | |
mfxdly | phase=36 | phase=54 | phase=72 | phase=90 | phase=108 | phase=126 |
---|
0x07 | | 0x073323 | 0x072212 | 0x071101 | 0x0700E0 | 0x07EEDE |
---|
0x06 | | 0x063323 | 0x062212 | 0x061101 | 0x0600E0 | 0x06EEDE |
---|
0x05 | | 0x053323 | 0x052212 | 0x051101 | 0x0500E0 | 0x05EEDE |
---|
0x04 | | 0x043323 | 0x042212 | 0x041101 | 0x0400E0 | 0x04EEDE |
---|
0x03 | | 0x033323 | 0x032212 | 0x031101 | 0x0300E0 | 0x03EEDE |
---|
0x02 | | 0x023323 | 0x022212 | 0x021101 | 0x0200E0 | 0x02EEDE |
---|
0x01 | | 0x013323 | 0x012212 | 0x011101 | 0x0100E0 | 0x01EEDE |
---|
0x00 | | 0x003323 | 0x002212 | 0x001101 | 0x0000E0 | 0x00EEDE |
---|
0x08 | | 0x083323 | 0x082212 | 0x081101 | 0x0800E0 | 0x08EEDE |
---|
0x10 | | 0x103323 | 0x102212 | 0x101101 | 0x1000E0 | 0x10EEDE |
---|
0x18 | | 0x183323 | 0x182212 | 0x181101 | 0x1800E0 | 0x18EEDE |
---|
0x20 | | 0x203323 | 0x202212 | 0x201101 | 0x2000E0 | 0x20EEDE |
---|
0x28 | | 0x283323 | 0x282212 | 0x281101 | 0x2800E0 | 0x28EEDE |
---|
0x30 | | 0x303323 | 0x302212 | 0x301101 | 0x3000E0 | 0x30EEDE |
---|
0x38 | | 0x383323 | 0x382212 | 0x381101 | 0x3800E0 | 0x38EEDE |
---|
| Lane phase adjustments: [-1, -1, 0, -1]
Error statistics from memtester: [bitspread=22, bitflip=10]
Best number of successful memtester runs, which span over 1 columns (0-0): 29 Best number of successful memtester runs, which span over 2 columns (0-1): 43 Best number of successful memtester runs, which span over 3 columns (0-2): 61 Best number of successful memtester runs, which span over 4 columns (0-3): 66 Best number of successful memtester runs, which span over 5 columns (0-4): 66
Errors per lane: [7, 7, 27, 12]. Lane 1 is the most noisy/problematic.
Errors from the lane 0 are 58.3% eclipsed by the worst lane 1. Errors from the lane 2 are 100.0% eclipsed by the worst lane 1. Errors from the lane 3 are 100.0% eclipsed by the worst lane 1.
|
dcdc3_vol = 1250 dram_clk = 540 dram_type = 3 dram_rank_num = 1 dram_chip_density = 4096 dram_io_width = 16 dram_bus_width = 32 dram_cas = 9 dram_zq = 0x7f dram_odt_en = 0 dram_tpr0 = 0x42d899b7 dram_tpr1 = 0xa090 dram_tpr2 = 0x22a00 dram_tpr3 = 0x0 dram_emr1 = 0x4 dram_emr2 = 0x10 dram_emr3 = 0x0 | |
mfxdly | phase=36 | phase=54 | phase=72 | phase=90 | phase=108 | phase=126 |
---|
0x07 | | | 0x073313 | 0x072202 | 0x0711E1 | 0x0700D0 |
---|
0x06 | | | 0x063313 | 0x062202 | 0x0611E1 | 0x0600D0 |
---|
0x05 | | | 0x053313 | 0x052202 | 0x0511E1 | 0x0500D0 |
---|
0x04 | | | 0x043313 | 0x042202 | 0x0411E1 | 0x0400D0 |
---|
0x03 | | | 0x033313 | 0x032202 | 0x0311E1 | 0x0300D0 |
---|
0x02 | | | 0x023313 | 0x022202 | 0x0211E1 | 0x0200D0 |
---|
0x01 | | | 0x013313 | 0x012202 | 0x0111E1 | 0x0100D0 |
---|
0x00 | | | 0x003313 | 0x002202 | 0x0011E1 | 0x0000D0 |
---|
0x08 | | | 0x083313 | 0x082202 | 0x0811E1 | 0x0800D0 |
---|
0x10 | | | 0x103313 | 0x102202 | 0x1011E1 | 0x1000D0 |
---|
0x18 | | | 0x183313 | 0x182202 | 0x1811E1 | 0x1800D0 |
---|
0x20 | | | 0x203313 | 0x202202 | 0x2011E1 | 0x2000D0 |
---|
0x28 | | | 0x283313 | 0x282202 | 0x2811E1 | 0x2800D0 |
---|
0x30 | | | 0x303313 | 0x302202 | 0x3011E1 | 0x3000D0 |
---|
0x38 | | | 0x383313 | 0x382202 | 0x3811E1 | 0x3800D0 |
---|
| Lane phase adjustments: [-2, -2, 0, -2]
Error statistics from memtester: [bitspread=17, bitflip=12, solidbits=1]
Best number of successful memtester runs, which span over 1 columns (1-1): 20 Best number of successful memtester runs, which span over 2 columns (0-1): 38 Best number of successful memtester runs, which span over 3 columns (0-2): 40 Best number of successful memtester runs, which span over 4 columns (0-3): 40
Errors per lane: [8, 8, 29, 7]. Lane 1 is the most noisy/problematic.
Errors from the lane 0 are 100.0% eclipsed by the worst lane 1. Errors from the lane 2 are 87.5% eclipsed by the worst lane 1. Errors from the lane 3 are 87.5% eclipsed by the worst lane 1.
|
dcdc3_vol = 1250 dram_clk = 540 dram_type = 3 dram_rank_num = 1 dram_chip_density = 4096 dram_io_width = 16 dram_bus_width = 32 dram_cas = 9 dram_zq = 0x7f dram_odt_en = 0 dram_tpr0 = 0x42d899b7 dram_tpr1 = 0xa090 dram_tpr2 = 0x22a00 dram_tpr3 = 0x0 dram_emr1 = 0x4 dram_emr2 = 0x10 dram_emr3 = 0x0 | |
mfxdly | phase=36 | phase=54 | phase=72 | phase=90 | phase=108 | phase=126 |
---|
0x07 | | | 0x072113 | 0x071002 | 0x070EE1 | 0x07EDD0 |
---|
0x06 | | | 0x062113 | 0x061002 | 0x060EE1 | 0x06EDD0 |
---|
0x05 | | | 0x052113 | 0x051002 | 0x050EE1 | 0x05EDD0 |
---|
0x04 | | | 0x042113 | 0x041002 | 0x040EE1 | 0x04EDD0 |
---|
0x03 | | | 0x032113 | 0x031002 | 0x030EE1 | 0x03EDD0 |
---|
0x02 | | | 0x022113 | 0x021002 | 0x020EE1 | 0x02EDD0 |
---|
0x01 | | | 0x012113 | 0x011002 | 0x010EE1 | 0x01EDD0 |
---|
0x00 | | | 0x002113 | 0x001002 | 0x000EE1 | 0x00EDD0 |
---|
0x08 | | | 0x082113 | 0x081002 | 0x080EE1 | 0x08EDD0 |
---|
0x10 | | | 0x102113 | 0x101002 | 0x100EE1 | 0x10EDD0 |
---|
0x18 | | | 0x182113 | 0x181002 | 0x180EE1 | 0x18EDD0 |
---|
0x20 | | | 0x202113 | 0x201002 | 0x200EE1 | 0x20EDD0 |
---|
0x28 | | | 0x282113 | 0x281002 | 0x280EE1 | 0x28EDD0 |
---|
0x30 | | | 0x302113 | 0x301002 | 0x300EE1 | 0x30EDD0 |
---|
0x38 | | | 0x382113 | 0x381002 | 0x380EE1 | 0x38EDD0 |
---|
| Lane phase adjustments: [-1, 0, 0, -2]
Error statistics from memtester: [bitspread=18, bitflip=15, solidbits=3]
Best number of successful memtester runs, which span over 1 columns (1-1): 20 Best number of successful memtester runs, which span over 2 columns (0-1): 35 Best number of successful memtester runs, which span over 3 columns (0-2): 41 Best number of successful memtester runs, which span over 4 columns (0-3): 41
Errors per lane: [13, 13, 36, 13]. Lane 1 is the most noisy/problematic.
Errors from the lane 0 are 100.0% eclipsed by the worst lane 1. Errors from the lane 2 are 100.0% eclipsed by the worst lane 1. Errors from the lane 3 are 100.0% eclipsed by the worst lane 1.
|